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Evaluating the Topological Surface Properties of Cu/Cr Thin Films Using 3D Atomic Force Microscopy Topographical Maps.

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Bibliographic Details
Title: Evaluating the Topological Surface Properties of Cu/Cr Thin Films Using 3D Atomic Force Microscopy Topographical Maps.
Authors: Sadeghi, Mohammad1, Zelati, Amir2, Rezaee, Sahar3, saharrezaee593@iauksh.ac.ir, Luna, Carlos4, Matos, Robert Saraiva5, Pires, Marcelo Amanajás6, Ferreira, Nilson S.7, da Fonseca Filho, Henrique Duarte8, Ahmadpourian, Azin3, Ţălu, Ştefan9, saharrezaee593@iauksh.ac.ir
Source: Coatings (2079-6412); Sep2022, Vol. 12 Issue 9, pN.PAG-N.PAG, 13p
Database: Applied Science & Technology Source
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ISSN:20796412
DOI:10.3390/coatings12091364