Optical characteristics with high accuracy of diluted Cr doped In2O3 thin films using spectroscopic ellipsometry for optoelectronic devices.
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| Title: | Optical characteristics with high accuracy of diluted Cr doped In2O3 thin films using spectroscopic ellipsometry for optoelectronic devices. |
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| Authors: | Ahmed, Moustafa1, mhafidh@kau.edu.sa, Bakry, Ahmed1, Shaaban, Essam R.2 |
| Source: | Optical Materials; Nov2022, Vol. 133, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 09253467 |
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| DOI: | 10.1016/j.optmat.2022.113039 |
