APA (7th ed.) Citation

Ahmed, M., Bakry, A., & Shaaban, E. R. (2022). Optical characteristics with high accuracy of diluted Cr doped In2O3 thin films using spectroscopic ellipsometry for optoelectronic devices. Optical Materials, 133, N.PAG. https://doi.org/10.1016/j.optmat.2022.113039

Chicago Style (17th ed.) Citation

Ahmed, Moustafa, Ahmed Bakry, and Essam R. Shaaban. "Optical Characteristics with High Accuracy of Diluted Cr Doped In2O3 Thin Films Using Spectroscopic Ellipsometry for Optoelectronic Devices." Optical Materials 133 (2022): N.PAG. https://doi.org/10.1016/j.optmat.2022.113039.

MLA (9th ed.) Citation

Ahmed, Moustafa, et al. "Optical Characteristics with High Accuracy of Diluted Cr Doped In2O3 Thin Films Using Spectroscopic Ellipsometry for Optoelectronic Devices." Optical Materials, vol. 133, 2022, p. N.PAG, https://doi.org/10.1016/j.optmat.2022.113039.