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Optical characteristics with high accuracy of diluted Cr doped In2O3 thin films using spectroscopic ellipsometry for optoelectronic devices.

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Bibliographic Details
Title: Optical characteristics with high accuracy of diluted Cr doped In2O3 thin films using spectroscopic ellipsometry for optoelectronic devices.
Authors: Ahmed, Moustafa1, mhafidh@kau.edu.sa, Bakry, Ahmed1, Shaaban, Essam R.2
Source: Optical Materials; Nov2022, Vol. 133, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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