APA (7th ed.) Citation

Alaya, C. B., Dridi Rezgui, B., Chaabouni, F., Khalfallah, B., Aouida, S., & Bouaïcha, M. (2023). Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: Application to three surface morphologies. Journal of Materials Science: Materials in Electronics, 34(5), 1. https://doi.org/10.1007/s10854-022-09537-3

Chicago Style (17th ed.) Citation

Alaya, C. Ben, B. Dridi Rezgui, F. Chaabouni, B. Khalfallah, S. Aouida, and M. Bouaïcha. "Correlation of 2D-interface Defect Density and Electrical Parameters of a GZO/p-Si Heterojunctions: Application to Three Surface Morphologies." Journal of Materials Science: Materials in Electronics 34, no. 5 (2023): 1. https://doi.org/10.1007/s10854-022-09537-3.

MLA (9th ed.) Citation

Alaya, C. Ben, et al. "Correlation of 2D-interface Defect Density and Electrical Parameters of a GZO/p-Si Heterojunctions: Application to Three Surface Morphologies." Journal of Materials Science: Materials in Electronics, vol. 34, no. 5, 2023, p. 1, https://doi.org/10.1007/s10854-022-09537-3.