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Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: application to three surface morphologies.

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Title: Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: application to three surface morphologies.
Authors: Alaya, C. Ben1, Dridi Rezgui, B.1, Chaabouni, F.2, Khalfallah, B.2, Aouida, S.1, Bouaïcha, M.1, Mongi.Bouaicha@crten.rnrt.tn
Source: Journal of Materials Science: Materials in Electronics; Feb2023, Vol. 34 Issue 5, p1-18, 18p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 161981992
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: application to three surface morphologies.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Alaya%2C+C%2E+Ben%22">Alaya, C. Ben</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dridi+Rezgui%2C+B%2E%22">Dridi Rezgui, B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chaabouni%2C+F%2E%22">Chaabouni, F.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Khalfallah%2C+B%2E%22">Khalfallah, B.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Aouida%2C+S%2E%22">Aouida, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Bouaïcha%2C+M%2E%22">Bouaïcha, M.</searchLink><relatesTo>1</relatesTo>, <i>Mongi.Bouaicha@crten.rnrt.tn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Feb2023, Vol. 34 Issue 5, p1-18, 18p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=161981992
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-022-09537-3
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 18
        StartPage: 1
    Titles:
      – TitleFull: Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: application to three surface morphologies.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Alaya, C. Ben
      – PersonEntity:
          Name:
            NameFull: Dridi Rezgui, B.
      – PersonEntity:
          Name:
            NameFull: Chaabouni, F.
      – PersonEntity:
          Name:
            NameFull: Khalfallah, B.
      – PersonEntity:
          Name:
            NameFull: Aouida, S.
      – PersonEntity:
          Name:
            NameFull: Bouaïcha, M.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 02
              Text: Feb2023
              Type: published
              Y: 2023
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 34
            – Type: issue
              Value: 5
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1