Optical and geometric parameter extraction across 300-mm photonic integrated circuit wafers.

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Bibliographic Details
Title: Optical and geometric parameter extraction across 300-mm photonic integrated circuit wafers.
Authors: Butt, Jordan N.1,2, Tyndall, Nathan F.1, Pruessner, Marcel W.1, Walsh, Kyle J.1, Miller, Benjamin L.3,4, Fahrenkopf, Nicholas M.5,6, Antohe, Alin O.5,6, Stievater, Todd H.1, todd.h.stievater.civ@us.navy.mil
Source: APL Photonics; Jan2024, Vol. 9 Issue 1, p1-8, 8p
Database: Applied Science & Technology Source
Description
ISSN:23780967
DOI:10.1063/5.0173914