Butt, J. N., Tyndall, N. F., Pruessner, M. W., Walsh, K. J., Miller, B. L., Fahrenkopf, N. M., . . . Stievater, T. H. (2024). Optical and geometric parameter extraction across 300-mm photonic integrated circuit wafers. APL Photonics, 9(1), 1. https://doi.org/10.1063/5.0173914
Chicago Style (17th ed.) CitationButt, Jordan N., Nathan F. Tyndall, Marcel W. Pruessner, Kyle J. Walsh, Benjamin L. Miller, Nicholas M. Fahrenkopf, Alin O. Antohe, and Todd H. Stievater. "Optical and Geometric Parameter Extraction Across 300-mm Photonic Integrated Circuit Wafers." APL Photonics 9, no. 1 (2024): 1. https://doi.org/10.1063/5.0173914.
MLA (9th ed.) CitationButt, Jordan N., et al. "Optical and Geometric Parameter Extraction Across 300-mm Photonic Integrated Circuit Wafers." APL Photonics, vol. 9, no. 1, 2024, p. 1, https://doi.org/10.1063/5.0173914.