Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.
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| Title: | Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm. |
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| Authors: | Gao, Xuan1, Dai, Le1, Liu, Yang1, Wang, Ke2, Karpinsky, D. V.3, Liu, Lisha1, lishaliu@njust.edu.cn, Wang, Yaojin1, yjwang@njust.edu.cn |
| Source: | Journal of the American Ceramic Society; May2024, Vol. 107 Issue 5, p3301-3312, 12p |
| Database: | Applied Science & Technology Source |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 175801824 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Gao%2C+Xuan%22">Gao, Xuan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dai%2C+Le%22">Dai, Le</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Yang%22">Liu, Yang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Ke%22">Wang, Ke</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Karpinsky%2C+D%2E+V%2E%22">Karpinsky, D. V.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Lisha%22">Liu, Lisha</searchLink><relatesTo>1</relatesTo>, <i>lishaliu@njust.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Yaojin%22">Wang, Yaojin</searchLink><relatesTo>1</relatesTo>, <i>yjwang@njust.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+the+American+Ceramic+Society%22">Journal of the American Ceramic Society</searchLink>; May2024, Vol. 107 Issue 5, p3301-3312, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=175801824 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1111/jace.19639 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 3301 Titles: – TitleFull: Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Gao, Xuan – PersonEntity: Name: NameFull: Dai, Le – PersonEntity: Name: NameFull: Liu, Yang – PersonEntity: Name: NameFull: Wang, Ke – PersonEntity: Name: NameFull: Karpinsky, D. V. – PersonEntity: Name: NameFull: Liu, Lisha – PersonEntity: Name: NameFull: Wang, Yaojin IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 00027820 Numbering: – Type: volume Value: 107 – Type: issue Value: 5 Titles: – TitleFull: Journal of the American Ceramic Society Type: main |
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