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SILAR-engineered ZnO thin films: exploring the impact of Ni, Co, and Fe dopants on structural, optical, and electronic properties.

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Title: SILAR-engineered ZnO thin films: exploring the impact of Ni, Co, and Fe dopants on structural, optical, and electronic properties.
Authors: Benaicha, Ismail1, Benaicha.ismail@uit.ac.ma, Ait-Alla, Youness1, Mhalla, Jaouad1, BakkalI, Ridouane1, Daoudi, Othmane1, Jelall, Ilyass1, Nouneh, Khalid1, Fahoume, Mounir1, Qachaou, Ahmed1
Source: Journal of Materials Science: Materials in Electronics; May2024, Vol. 35 Issue 13, p1-9, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
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An: 177097878
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  Data: SILAR-engineered ZnO thin films: exploring the impact of Ni, Co, and Fe dopants on structural, optical, and electronic properties.
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  Data: <searchLink fieldCode="AU" term="%22Benaicha%2C+Ismail%22">Benaicha, Ismail</searchLink><relatesTo>1</relatesTo>, <i>Benaicha.ismail@uit.ac.ma</i><br /><searchLink fieldCode="AU" term="%22Ait-Alla%2C+Youness%22">Ait-Alla, Youness</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Mhalla%2C+Jaouad%22">Mhalla, Jaouad</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22BakkalI%2C+Ridouane%22">BakkalI, Ridouane</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Daoudi%2C+Othmane%22">Daoudi, Othmane</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Jelall%2C+Ilyass%22">Jelall, Ilyass</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Nouneh%2C+Khalid%22">Nouneh, Khalid</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Fahoume%2C+Mounir%22">Fahoume, Mounir</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Qachaou%2C+Ahmed%22">Qachaou, Ahmed</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; May2024, Vol. 35 Issue 13, p1-9, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=177097878
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        Value: 10.1007/s10854-024-12678-2
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      – TitleFull: SILAR-engineered ZnO thin films: exploring the impact of Ni, Co, and Fe dopants on structural, optical, and electronic properties.
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              Text: May2024
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              Y: 2024
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