Uncertainty-aware particle segmentation for electron microscopy at varied length scales.
Saved in:
| Title: | Uncertainty-aware particle segmentation for electron microscopy at varied length scales. |
|---|---|
| Authors: | Rettenberger, Luca1, Szymanski, Nathan J.2, Zeng, Yan3, Schuetzke, Jan1, Wang, Shilong2, Ceder, Gerbrand2, Reischl, Markus1, markus.reischl@kit.edu |
| Source: | NPJ Computational Materials; 6/12/2024, Vol. 10 Issue 1, p1-9, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 20573960 |
|---|---|
| DOI: | 10.1038/s41524-024-01302-w |
