APA (7th ed.) Citation

Rettenberger, L., Szymanski, N. J., Zeng, Y., Schuetzke, J., Wang, S., Ceder, G., & Reischl, M. (2024). Uncertainty-aware particle segmentation for electron microscopy at varied length scales. NPJ Computational Materials, 10(1), 1. https://doi.org/10.1038/s41524-024-01302-w

Chicago Style (17th ed.) Citation

Rettenberger, Luca, Nathan J. Szymanski, Yan Zeng, Jan Schuetzke, Shilong Wang, Gerbrand Ceder, and Markus Reischl. "Uncertainty-aware Particle Segmentation for Electron Microscopy at Varied Length Scales." NPJ Computational Materials 10, no. 1 (2024): 1. https://doi.org/10.1038/s41524-024-01302-w.

MLA (9th ed.) Citation

Rettenberger, Luca, et al. "Uncertainty-aware Particle Segmentation for Electron Microscopy at Varied Length Scales." NPJ Computational Materials, vol. 10, no. 1, 2024, p. 1, https://doi.org/10.1038/s41524-024-01302-w.