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Uncertainty-aware particle segmentation for electron microscopy at varied length scales.

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Bibliographic Details
Title: Uncertainty-aware particle segmentation for electron microscopy at varied length scales.
Authors: Rettenberger, Luca1, Szymanski, Nathan J.2, Zeng, Yan3, Schuetzke, Jan1, Wang, Shilong2, Ceder, Gerbrand2, Reischl, Markus1, markus.reischl@kit.edu
Source: NPJ Computational Materials; 6/12/2024, Vol. 10 Issue 1, p1-9, 9p
Database: Applied Science & Technology Source
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