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Exploring the role of film thickness and oxygen vacancies on the H2S gas-sensing performance of RF magnetron-sputtered NiO thin films.

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Bibliographic Details
Title:	Exploring the role of film thickness and oxygen vacancies on the H2S gas-sensing performance of RF magnetron-sputtered NiO thin films.
Authors:	Srivastava, Stuti^1,2, Dwivedi, Charu¹, Kumar, Ashwani^3,4, Gupta, Govind^1,2, Singh, Preetam^1,2, singhp@nplindia.org
Source:	Journal of Materials Science; Oct2024, Vol. 59 Issue 37, p17322-17337, 16p
Database:	Applied Science & Technology Source
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ISSN:	00222461
DOI:	10.1007/s10853-024-10204-7