The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates.
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| Title: | The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates. |
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| Authors: | Kruszewski, Piotr1, konrad@unipress.waw.plkruszew@unipress.waw.pl, Sakowski, Konrad1,2, pprysta@unipress.waw.pl, Gościński, Krzysztof3, kgosc@ifpan.edu.pl, Prystawko, Paweł1 |
| Source: | Applied Sciences (2076-3417); Oct2024, Vol. 14 Issue 19, p8785, 11p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 180273402 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Kruszewski%2C+Piotr%22">Kruszewski, Piotr</searchLink><relatesTo>1</relatesTo>, <i>konrad@unipress.waw.plkruszew@unipress.waw.pl</i><br /><searchLink fieldCode="AU" term="%22Sakowski%2C+Konrad%22">Sakowski, Konrad</searchLink><relatesTo>1,2</relatesTo>, <i>pprysta@unipress.waw.pl</i><br /><searchLink fieldCode="AU" term="%22Gościński%2C+Krzysztof%22">Gościński, Krzysztof</searchLink><relatesTo>3</relatesTo>, <i>kgosc@ifpan.edu.pl</i><br /><searchLink fieldCode="AU" term="%22Prystawko%2C+Paweł%22">Prystawko, Paweł</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Sciences+%282076-3417%29%22">Applied Sciences (2076-3417)</searchLink>; Oct2024, Vol. 14 Issue 19, p8785, 11p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=180273402 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/app14198785 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 8785 Titles: – TitleFull: The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kruszewski, Piotr – PersonEntity: Name: NameFull: Sakowski, Konrad – PersonEntity: Name: NameFull: Gościński, Krzysztof – PersonEntity: Name: NameFull: Prystawko, Paweł IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 20763417 Numbering: – Type: volume Value: 14 – Type: issue Value: 19 Titles: – TitleFull: Applied Sciences (2076-3417) Type: main |
| ResultId | 1 |