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Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain.

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Title: Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain.
Authors: Kang, Tae Yeob1, Lee, Haebom2, Suh, Sungho1,3,4, sungho.suh@dfki.de
Source: Microelectronics Reliability; Nov2024, Vol. 162, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 180630852
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=180630852
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2024.115518
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 1
        StartPage: N.PAG
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      – TitleFull: Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain.
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            NameFull: Kang, Tae Yeob
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            NameFull: Lee, Haebom
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            NameFull: Suh, Sungho
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          Dates:
            – D: 01
              M: 11
              Text: Nov2024
              Type: published
              Y: 2024
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              Value: 162
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            – TitleFull: Microelectronics Reliability
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