Bibliographic Details
| Title: |
Ultra-fast single-crystal CVD diamonds in the particle time-of-flight (PTOF) detector for low yield burn-history measurements on the NIF (invited). |
| Authors: |
Reichelt, B. L.1, blr@mit.edu, Kishimori, R.1, Lawrence, Y.1, Wink, C. W.1, Johnson, M. Gatu1, Johnson, T. M.1, Adrian, P. J.2, Baker, K. L.3, Casey, D. T.3, Clark, D. S.3, Dannhoff, S. G.1, Eckart, M. J.3, Evans, T. E.1, Geppert-Kleinrath, H.2, Gibson, D.3, Hahn, K. D.3, Higginson, D. P.3, Izumi, N.3, Kabadi, N. V.4, Kerr, S.3 |
| Source: |
Review of Scientific Instruments; Jan2025, Vol. 96 Issue 1, p1-10, 10p |
| Database: |
Applied Science & Technology Source |
