Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT.
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| Title: | Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT. |
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| Authors: | Wang, Jian-Jian1,2,3, Yan, Gang-Ping1,2, Bi, Jin-Shun2,4, bijinshun@gznu.edu.cn, Majumdar, Sandip5, Ma, Yue1,2, Xu, Gao-Bo1,2, xugaobo@ime.ac.cn |
| Source: | Journal of Materials Science: Materials in Electronics; Feb2025, Vol. 36 Issue 6, p1-12, 12p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-025-14458-y |
