View in EDS HTML Full Text PDF Full Text

Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT.

Saved in:
Bibliographic Details
Title: Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT.
Authors: Wang, Jian-Jian1,2,3, Yan, Gang-Ping1,2, Bi, Jin-Shun2,4, bijinshun@gznu.edu.cn, Majumdar, Sandip5, Ma, Yue1,2, Xu, Gao-Bo1,2, xugaobo@ime.ac.cn
Source: Journal of Materials Science: Materials in Electronics; Feb2025, Vol. 36 Issue 6, p1-12, 12p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 183309369
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Jian-Jian%22">Wang, Jian-Jian</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Yan%2C+Gang-Ping%22">Yan, Gang-Ping</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Bi%2C+Jin-Shun%22">Bi, Jin-Shun</searchLink><relatesTo>2,4</relatesTo>, <i>bijinshun@gznu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Majumdar%2C+Sandip%22">Majumdar, Sandip</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Ma%2C+Yue%22">Ma, Yue</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Xu%2C+Gao-Bo%22">Xu, Gao-Bo</searchLink><relatesTo>1,2</relatesTo>, <i>xugaobo@ime.ac.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Feb2025, Vol. 36 Issue 6, p1-12, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=183309369
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-025-14458-y
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 1
    Titles:
      – TitleFull: Analysis of total ionizing dose effect and degradation mechanism of a-IGZO TFT.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wang, Jian-Jian
      – PersonEntity:
          Name:
            NameFull: Yan, Gang-Ping
      – PersonEntity:
          Name:
            NameFull: Bi, Jin-Shun
      – PersonEntity:
          Name:
            NameFull: Majumdar, Sandip
      – PersonEntity:
          Name:
            NameFull: Ma, Yue
      – PersonEntity:
          Name:
            NameFull: Xu, Gao-Bo
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 21
              M: 02
              Text: Feb2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 36
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1