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LLM-Powered Static Binary Taint Analysis.

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Bibliographic Details
Title: LLM-Powered Static Binary Taint Analysis.
Authors: Liu, Puzhuo1, liupuzhuo.lpz@antgroup.com, Sun, Chengnian2, cnsun@uwaterloo.ca, Zheng, Yaowen3, zhengyaowen@iie.ac.cn, Feng, Xuan4, xfeng9209@gmail.com, Qin, Chuan3, qinchuan@iie.ac.cn, Wang, Yuncheng3, wangyuncheng@iie.ac.cn, Xu, Zhenyang2, zhenyang.xu@uwaterloo.ca, Li, Zhi3, lizhi@iie.ac.cn, Di, Peng5, dipeng.dp@antgroup.com, Jiang, Yu6, jy1989@mail.tsinghua.edu.cn, Sun, Limin3, sunlimin@iie.ac.cn
Source: ACM Transactions on Software Engineering & Methodology; Mar2025, Vol. 34 Issue 3, p1-36, 36p
Database: Applied Science & Technology Source
Description
ISSN:1049331X
DOI:10.1145/3711816