APA (7th ed.) Citation

Liu, P., Sun, C., Zheng, Y., Feng, X., Qin, C., Wang, Y., . . . Sun, L. (2025). LLM-Powered Static Binary Taint Analysis. ACM Transactions on Software Engineering & Methodology, 34(3), 1. https://doi.org/10.1145/3711816

Chicago Style (17th ed.) Citation

Liu, Puzhuo, et al. "LLM-Powered Static Binary Taint Analysis." ACM Transactions on Software Engineering & Methodology 34, no. 3 (2025): 1. https://doi.org/10.1145/3711816.

MLA (9th ed.) Citation

Liu, Puzhuo, et al. "LLM-Powered Static Binary Taint Analysis." ACM Transactions on Software Engineering & Methodology, vol. 34, no. 3, 2025, p. 1, https://doi.org/10.1145/3711816.