Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.
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| Title: | Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications. |
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| Authors: | Lamprecht, Rouven1, rola@tf.uni-kiel.de, Vialetto, Luca2,3, Gergs, Tobias2, Zahari, Finn1, Marquardt, Richard1, Kohlstedt, Hermann1,4, Trieschmann, Jan2,4, jt@tf.uni-kiel.de |
| Source: | Advanced Engineering Materials; Jan2025, Vol. 27 Issue 2, p1-10, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 14381656 |
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| DOI: | 10.1002/adem.202401824 |
