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Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.

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Title: Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.
Authors: Lamprecht, Rouven1, rola@tf.uni-kiel.de, Vialetto, Luca2,3, Gergs, Tobias2, Zahari, Finn1, Marquardt, Richard1, Kohlstedt, Hermann1,4, Trieschmann, Jan2,4, jt@tf.uni-kiel.de
Source: Advanced Engineering Materials; Jan2025, Vol. 27 Issue 2, p1-10, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 183756464
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Lamprecht%2C+Rouven%22">Lamprecht, Rouven</searchLink><relatesTo>1</relatesTo>, <i>rola@tf.uni-kiel.de</i><br /><searchLink fieldCode="AU" term="%22Vialetto%2C+Luca%22">Vialetto, Luca</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Gergs%2C+Tobias%22">Gergs, Tobias</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zahari%2C+Finn%22">Zahari, Finn</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Marquardt%2C+Richard%22">Marquardt, Richard</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kohlstedt%2C+Hermann%22">Kohlstedt, Hermann</searchLink><relatesTo>1,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Trieschmann%2C+Jan%22">Trieschmann, Jan</searchLink><relatesTo>2,4</relatesTo>, <i>jt@tf.uni-kiel.de</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Advanced+Engineering+Materials%22">Advanced Engineering Materials</searchLink>; Jan2025, Vol. 27 Issue 2, p1-10, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=183756464
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/adem.202401824
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 1
    Titles:
      – TitleFull: Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Lamprecht, Rouven
      – PersonEntity:
          Name:
            NameFull: Vialetto, Luca
      – PersonEntity:
          Name:
            NameFull: Gergs, Tobias
      – PersonEntity:
          Name:
            NameFull: Zahari, Finn
      – PersonEntity:
          Name:
            NameFull: Marquardt, Richard
      – PersonEntity:
          Name:
            NameFull: Kohlstedt, Hermann
      – PersonEntity:
          Name:
            NameFull: Trieschmann, Jan
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 01
              Text: Jan2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 14381656
          Numbering:
            – Type: volume
              Value: 27
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Advanced Engineering Materials
              Type: main
ResultId 1