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Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.

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Bibliographic Details
Title: Thickness‐Related Analog Switching in SiOx/Cu/SiOx Memristive Devices for Neuromorphic Applications.
Authors: Lamprecht, Rouven1, rola@tf.uni-kiel.de, Vialetto, Luca2,3, Gergs, Tobias2, Zahari, Finn1, Marquardt, Richard1, Kohlstedt, Hermann1,4, Trieschmann, Jan2,4, jt@tf.uni-kiel.de
Source: Advanced Engineering Materials; Jan2025, Vol. 27 Issue 2, p1-10, 10p
Database: Applied Science & Technology Source
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