Hensling, F. V., Vogt, P., Park, J., Shang, S., Ye, H., Wu, Y., . . . Schlom, D. G. (2025). Fully Transparent Epitaxial Oxide Thin‐Film Transistor Fabricated at Back‐End‐of‐Line Temperature by Suboxide Molecular‐Beam Epitaxy. Advanced Electronic Materials, 11(3), 1. https://doi.org/10.1002/aelm.202400499
Chicago Style (17th ed.) CitationHensling, Felix V.E., et al. "Fully Transparent Epitaxial Oxide Thin‐Film Transistor Fabricated at Back‐End‐of‐Line Temperature by Suboxide Molecular‐Beam Epitaxy." Advanced Electronic Materials 11, no. 3 (2025): 1. https://doi.org/10.1002/aelm.202400499.
MLA (9th ed.) CitationHensling, Felix V.E., et al. "Fully Transparent Epitaxial Oxide Thin‐Film Transistor Fabricated at Back‐End‐of‐Line Temperature by Suboxide Molecular‐Beam Epitaxy." Advanced Electronic Materials, vol. 11, no. 3, 2025, p. 1, https://doi.org/10.1002/aelm.202400499.