Comprehensive Electrothermal Characterization Analysis for Scaled Nanochannels in Gate‐All‐Around Field‐Effect Transistors.
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| Title: | Comprehensive Electrothermal Characterization Analysis for Scaled Nanochannels in Gate‐All‐Around Field‐Effect Transistors. |
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| Authors: | Wang, Ziping1, Li, Fei2, Sun, Yabin1, Shi, Yanling1, Li, Xiaoji1, xjli@ee.ecnu.edu.cn |
| Source: | International Journal of Numerical Modelling; Jan/Feb2025, Vol. 38 Issue 1, p1-10, 10p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 08943370 |
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| DOI: | 10.1002/jnm.70017 |
