Analysis of the influence of defect evolution on the performance and damage of 4H-SiC photoconductive semiconductor switches.
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| Title: | Analysis of the influence of defect evolution on the performance and damage of 4H-SiC photoconductive semiconductor switches. |
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| Authors: | Chen, Zhipeng1, Huang, Zhuocheng1, Sun, Qian1, Xu, Kun1, Lin, Zhouyang1, Zheng, Zhong1, Wu, Zhaoyang2, Zhang, Wei3, Guo, Hui1, Liu, Yapeng4, Zhang, Yuming1, Peng, Bo1, Wang, Yutian1, ytwang@xidian.edu.cn |
| Source: | Journal of Applied Physics; 5/7/2025, Vol. 137 Issue 17, p1-9, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/5.0271142 |
