APA (7th ed.) Citation

Chen, Z., Huang, Z., Sun, Q., Xu, K., Lin, Z., Zheng, Z., . . . Wang, Y. (2025). Analysis of the influence of defect evolution on the performance and damage of 4H-SiC photoconductive semiconductor switches. Journal of Applied Physics, 137(17), 1. https://doi.org/10.1063/5.0271142

Chicago Style (17th ed.) Citation

Chen, Zhipeng, et al. "Analysis of the Influence of Defect Evolution on the Performance and Damage of 4H-SiC Photoconductive Semiconductor Switches." Journal of Applied Physics 137, no. 17 (2025): 1. https://doi.org/10.1063/5.0271142.

MLA (9th ed.) Citation

Chen, Zhipeng, et al. "Analysis of the Influence of Defect Evolution on the Performance and Damage of 4H-SiC Photoconductive Semiconductor Switches." Journal of Applied Physics, vol. 137, no. 17, 2025, p. 1, https://doi.org/10.1063/5.0271142.