View in EDS HTML Full Text PDF Full Text

Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree.

Saved in:
Bibliographic Details
Title: Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree.
Authors: Cao, Qian1, Liang, Lizhen2, lzliang@ipp.ac.cn
Source: Applied Sciences (2076-3417); Aug2025, Vol. 15 Issue 15, p8556, 17p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:20763417
DOI:10.3390/app15158556