APA (7th ed.) Citation

Cao, Q., & Liang, L. (2025). Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree. Applied Sciences (2076-3417), 15(15), 8556. https://doi.org/10.3390/app15158556

Chicago Style (17th ed.) Citation

Cao, Qian, and Lizhen Liang. "Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree." Applied Sciences (2076-3417) 15, no. 15 (2025): 8556. https://doi.org/10.3390/app15158556.

MLA (9th ed.) Citation

Cao, Qian, and Lizhen Liang. "Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree." Applied Sciences (2076-3417), vol. 15, no. 15, 2025, p. 8556, https://doi.org/10.3390/app15158556.