Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree.
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| Title: | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree. |
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| Authors: | Cao, Qian1, Liang, Lizhen2, lzliang@ipp.ac.cn |
| Source: | Applied Sciences (2076-3417); Aug2025, Vol. 15 Issue 15, p8556, 17p |
| Database: | Applied Science & Technology Source |
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