APA (7th ed.) Citation

Bordovalos, A., Kanneboina, V., Dulal, P., Ramanujam, B., Shan, A., & Podraza, N. J. (2025). Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films. Journal of Applied Physics, 138(9), 1. https://doi.org/10.1063/5.0278813

Chicago Style (17th ed.) Citation

Bordovalos, Alexander, Venkanna Kanneboina, Prabin Dulal, Balaji Ramanujam, Ambalanath Shan, and Nikolas J. Podraza. "Artificial Neural Network Assisted Spectroscopic Ellipsometry Data Analysis of Hydrogenated Amorphous Silicon Thin Films." Journal of Applied Physics 138, no. 9 (2025): 1. https://doi.org/10.1063/5.0278813.

MLA (9th ed.) Citation

Bordovalos, Alexander, et al. "Artificial Neural Network Assisted Spectroscopic Ellipsometry Data Analysis of Hydrogenated Amorphous Silicon Thin Films." Journal of Applied Physics, vol. 138, no. 9, 2025, p. 1, https://doi.org/10.1063/5.0278813.