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Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.

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Bibliographic Details
Title: Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.
Authors: Bordovalos, Alexander1, Alexander.Bordovalos@rockets.utoledo.edu, Kanneboina, Venkanna1, Dulal, Prabin1, Ramanujam, Balaji1, Shan, Ambalanath1, Podraza, Nikolas J.1, Alexander.Bordovalos@rockets.utoledo.edu
Source: Journal of Applied Physics; 9/7/2025, Vol. 138 Issue 9, p1-13, 13p
Database: Applied Science & Technology Source
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