Optimization of Defect Detection in Atomic Materials Using Graphene Layer.
Saved in:
| Title: | Optimization of Defect Detection in Atomic Materials Using Graphene Layer. |
|---|---|
| Authors: | Bhangale, Sonal C.1, bhangalesonalmk@sanjivani.org.in, Dhamande, Laxmikant S.2, Tingare, Bhagyashree Ashok3, Diwan, Tarun Dhar4, Kapgate, R. A.1, William, P.5, Patare, Prasad M.2 |
| Source: | Journal of Nano- & Electronic Physics; 2025, Vol. 17 Issue 4, p04028-1-04028-5, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 20776772 |
|---|---|
| DOI: | 10.21272/jnep.17(4).04028 |
