Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.

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Bibliographic Details
Title:	Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.
Authors:	Hongchuan JIA¹, Fayu WAN¹, xinc1108@163.com, Xin CHENG¹, xchen@cup.edu.cn, MORDACHEV, Vladimir², jerome.rossignol@u-bourgogne.fr, SINKEVICH, Eugene², ROSSIGNOL, Jerome³, Xiaohe CHEN⁴, RAVELO, Blaise¹
Source:	Radioengineering; Sep2025, Vol. 34 Issue 3, p452-460, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	12102512
DOI:	10.13164/re.2025.0452