APA (7th ed.) Citation

JIA, H., WAN, F., CHENG, X., MORDACHEV, V., SINKEVICH, E., ROSSIGNOL, J., . . . RAVELO, B. (2025). Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement. Radioengineering, 34(3), 452. https://doi.org/10.13164/re.2025.0452

Chicago Style (17th ed.) Citation

JIA, Hongchuan, Fayu WAN, Xin CHENG, Vladimir MORDACHEV, Eugene SINKEVICH, Jerome ROSSIGNOL, Xiaohe CHEN, and Blaise RAVELO. "Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement." Radioengineering 34, no. 3 (2025): 452. https://doi.org/10.13164/re.2025.0452.

MLA (9th ed.) Citation

JIA, Hongchuan, et al. "Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement." Radioengineering, vol. 34, no. 3, 2025, p. 452, https://doi.org/10.13164/re.2025.0452.