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Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.

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Title: Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.
Authors: Hongchuan JIA1, Fayu WAN1, xinc1108@163.com, Xin CHENG1, xchen@cup.edu.cn, MORDACHEV, Vladimir2, jerome.rossignol@u-bourgogne.fr, SINKEVICH, Eugene2, ROSSIGNOL, Jerome3, Xiaohe CHEN4, RAVELO, Blaise1
Source: Radioengineering; Sep2025, Vol. 34 Issue 3, p452-460, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188938995
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.
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  Data: <searchLink fieldCode="JN" term="%22Radioengineering%22">Radioengineering</searchLink>; Sep2025, Vol. 34 Issue 3, p452-460, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188938995
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      – Type: doi
        Value: 10.13164/re.2025.0452
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 452
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      – TitleFull: Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.
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            NameFull: Hongchuan JIA
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            NameFull: Fayu WAN
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            NameFull: Xin CHENG
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            NameFull: SINKEVICH, Eugene
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            NameFull: ROSSIGNOL, Jerome
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            – D: 01
              M: 09
              Text: Sep2025
              Type: published
              Y: 2025
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            – TitleFull: Radioengineering
              Type: main
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