Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement.
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| Title: | Characterization of Four-Layer Microwave Magnetic Probe Design for Integrated Circuit Emission Measurement. |
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| Authors: | Hongchuan JIA1, Fayu WAN1, xinc1108@163.com, Xin CHENG1, xchen@cup.edu.cn, MORDACHEV, Vladimir2, jerome.rossignol@u-bourgogne.fr, SINKEVICH, Eugene2, ROSSIGNOL, Jerome3, Xiaohe CHEN4, RAVELO, Blaise1 |
| Source: | Radioengineering; Sep2025, Vol. 34 Issue 3, p452-460, 8p |
| Database: | Applied Science & Technology Source |
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