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Exploring low-frequency noise dynamics in a-IGZO TFTs: Unveiling the impact of contact metal variations for advanced semiconductor applications.

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Bibliographic Details
Title:	Exploring low-frequency noise dynamics in a-IGZO TFTs: Unveiling the impact of contact metal variations for advanced semiconductor applications.
Authors:	Park, Junseong¹, Kim, Haesung^1,2, Choi, Sung-Jin¹, Kim, Dae Hwan¹, Kim, Dong Myong¹, Bae, Jong-Ho^1,3, jbae@yonsei.ac.kr
Source:	Solid-State Electronics; Jan2026, Vol. 231, pN.PAG-N.PAG, 1p
Database:	Applied Science & Technology Source

Description
ISSN:	00381101
DOI:	10.1016/j.sse.2025.109271