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Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8.

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Bibliographic Details
Title: Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8.
Authors: Sun, Zhe1, zsun0442@uni.sydney.edu.au, Ma, Ruihan2, Lei, Qujiang3
Source: Applied Sciences (2076-3417); Jan2026, Vol. 16 Issue 2, p1078, 18p
Database: Applied Science & Technology Source
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ISSN:20763417
DOI:10.3390/app16021078