APA (7th ed.) Citation

Sun, Z., Ma, R., & Lei, Q. (2026). Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8. Applied Sciences (2076-3417), 16(2), 1078. https://doi.org/10.3390/app16021078

Chicago Style (17th ed.) Citation

Sun, Zhe, Ruihan Ma, and Qujiang Lei. "Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8." Applied Sciences (2076-3417) 16, no. 2 (2026): 1078. https://doi.org/10.3390/app16021078.

MLA (9th ed.) Citation

Sun, Zhe, et al. "Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8." Applied Sciences (2076-3417), vol. 16, no. 2, 2026, p. 1078, https://doi.org/10.3390/app16021078.