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Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8.

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Bibliographic Details
Title: Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8.
Authors: Sun, Zhe1, zsun0442@uni.sydney.edu.au, Ma, Ruihan2, Lei, Qujiang3
Source: Applied Sciences (2076-3417); Jan2026, Vol. 16 Issue 2, p1078, 18p
Database: Applied Science & Technology Source
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Header DbId: aci
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PubType: Academic Journal
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        Value: 10.3390/app16021078
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      – Code: eng
        Text: English
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        PageCount: 18
        StartPage: 1078
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      – TitleFull: Small PCB Defect Detection Based on Convolutional Block Attention Mechanism and YOLOv8.
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            NameFull: Sun, Zhe
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            NameFull: Ma, Ruihan
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              Text: Jan2026
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