Effect of substrate miscut angle on critical thickness, structural and electronic properties of MBE-grown NbN films on c-plane sapphire.

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Bibliographic Details
Title: Effect of substrate miscut angle on critical thickness, structural and electronic properties of MBE-grown NbN films on c-plane sapphire.
Authors: Ithepalli, Anand1, Vashishtha, Saumya2, Pieczulewski, Naomi1, Liu, Qiao1, Rajapurohita, Amit Rohan2, Barone, Matthew1, Schlom, Darrell1,3,4, Muller, David A.2,3, Xing, Huili Grace1,3,5, Jena, Debdeep1,3,5, djena@cornell.edu
Source: Applied Physics Letters; 1/26/2026, Vol. 128 Issue 4, p1-6, 6p
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/5.0312575