Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy.
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| Title: | Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy. |
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| Authors: | Tu, Youwang1, Zhu, Xiuchong1, Kang, Xiao1, Cao, Yixuan1, Zhang, Lei1, zhanglei@csu.edu.cn |
| Source: | Materials Research Letters; Mar2026, Vol. 14 Issue 3, p276-284, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 21663831 |
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| DOI: | 10.1080/21663831.2026.2613051 |
