APA (7th ed.) Citation

Tu, Y., Zhu, X., Kang, X., Cao, Y., & Zhang, L. (2026). Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy. Materials Research Letters, 14(3), 276. https://doi.org/10.1080/21663831.2026.2613051

Chicago Style (17th ed.) Citation

Tu, Youwang, Xiuchong Zhu, Xiao Kang, Yixuan Cao, and Lei Zhang. "Current-carrying Friction Induced Interfacial Degradation and Delamination Mechanism in AgCu10 Alloy." Materials Research Letters 14, no. 3 (2026): 276. https://doi.org/10.1080/21663831.2026.2613051.

MLA (9th ed.) Citation

Tu, Youwang, et al. "Current-carrying Friction Induced Interfacial Degradation and Delamination Mechanism in AgCu10 Alloy." Materials Research Letters, vol. 14, no. 3, 2026, p. 276, https://doi.org/10.1080/21663831.2026.2613051.