View in EDS

Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy.

Saved in:
Bibliographic Details
Title: Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy.
Authors: Tu, Youwang1, Zhu, Xiuchong1, Kang, Xiao1, Cao, Yixuan1, Zhang, Lei1, zhanglei@csu.edu.cn
Source: Materials Research Letters; Mar2026, Vol. 14 Issue 3, p276-284, 9p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 192006885
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Tu%2C+Youwang%22">Tu, Youwang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhu%2C+Xiuchong%22">Zhu, Xiuchong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kang%2C+Xiao%22">Kang, Xiao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Cao%2C+Yixuan%22">Cao, Yixuan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Lei%22">Zhang, Lei</searchLink><relatesTo>1</relatesTo>, <i>zhanglei@csu.edu.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Materials+Research+Letters%22">Materials Research Letters</searchLink>; Mar2026, Vol. 14 Issue 3, p276-284, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192006885
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/21663831.2026.2613051
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 9
        StartPage: 276
    Titles:
      – TitleFull: Current-carrying friction induced interfacial degradation and delamination mechanism in AgCu10 alloy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Tu, Youwang
      – PersonEntity:
          Name:
            NameFull: Zhu, Xiuchong
      – PersonEntity:
          Name:
            NameFull: Kang, Xiao
      – PersonEntity:
          Name:
            NameFull: Cao, Yixuan
      – PersonEntity:
          Name:
            NameFull: Zhang, Lei
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: Mar2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 21663831
          Numbering:
            – Type: volume
              Value: 14
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Materials Research Letters
              Type: main
ResultId 1