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Morphological and Energetic Characterization of Argon Cluster Impacts on Si and Ge Single Crystals Using MD Simulation.

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Bibliographic Details
Title:	Morphological and Energetic Characterization of Argon Cluster Impacts on Si and Ge Single Crystals Using MD Simulation.
Authors:	Nikolaev, Ivan V.¹, Stishenko, Pavel V.^1,2, Korobeishchikov, Nikolay G.^1,3, Tolstoguzov, Alexander B.^2,3,4
Source:	Coatings (2079-6412); Apr2026, Vol. 16 Issue 4, p411, 15p
Database:	Applied Science & Technology Source
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ISSN:	20796412
DOI:	10.3390/coatings16040411