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Morphological and Energetic Characterization of Argon Cluster Impacts on Si and Ge Single Crystals Using MD Simulation.

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Title: Morphological and Energetic Characterization of Argon Cluster Impacts on Si and Ge Single Crystals Using MD Simulation.
Authors: Nikolaev, Ivan V.1, Stishenko, Pavel V.1,2, Korobeishchikov, Nikolay G.1,3, Tolstoguzov, Alexander B.2,3,4
Source: Coatings (2079-6412); Apr2026, Vol. 16 Issue 4, p411, 15p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 193439892
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PubType: Academic Journal
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        Value: 10.3390/coatings16040411
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      – Code: eng
        Text: English
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        StartPage: 411
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      – TitleFull: Morphological and Energetic Characterization of Argon Cluster Impacts on Si and Ge Single Crystals Using MD Simulation.
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            NameFull: Nikolaev, Ivan V.
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              Text: Apr2026
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              Y: 2026
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              Value: 16
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