Parametric study and performance evaluation of the louver structure in the pumping pipeline of electron beam evaporation coating equipment.
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| Title: | Parametric study and performance evaluation of the louver structure in the pumping pipeline of electron beam evaporation coating equipment. |
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| Authors: | Yuan, Zuhao1, Li, Yong1, She, Pengcheng1, Gong, Jun1, Shi, Renping1, He, Qiufu1, Liu, Fangting2, Li, Junhui2, lijunhui@csu.edu.cn |
| Source: | Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2026, Vol. 44 Issue 3, p1-12, 12p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193810249 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Parametric study and performance evaluation of the louver structure in the pumping pipeline of electron beam evaporation coating equipment. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Yuan%2C+Zuhao%22">Yuan, Zuhao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Yong%22">Li, Yong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22She%2C+Pengcheng%22">She, Pengcheng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Gong%2C+Jun%22">Gong, Jun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Shi%2C+Renping%22">Shi, Renping</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22He%2C+Qiufu%22">He, Qiufu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Fangting%22">Liu, Fangting</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Junhui%22">Li, Junhui</searchLink><relatesTo>2</relatesTo>, <i>lijunhui@csu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+B-Nanotechnology+%26+Microelectronics%22">Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics</searchLink>; May2026, Vol. 44 Issue 3, p1-12, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193810249 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1116/6.0005283 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Titles: – TitleFull: Parametric study and performance evaluation of the louver structure in the pumping pipeline of electron beam evaporation coating equipment. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Yuan, Zuhao – PersonEntity: Name: NameFull: Li, Yong – PersonEntity: Name: NameFull: She, Pengcheng – PersonEntity: Name: NameFull: Gong, Jun – PersonEntity: Name: NameFull: Shi, Renping – PersonEntity: Name: NameFull: He, Qiufu – PersonEntity: Name: NameFull: Liu, Fangting – PersonEntity: Name: NameFull: Li, Junhui IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 21662746 Numbering: – Type: volume Value: 44 – Type: issue Value: 3 Titles: – TitleFull: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics Type: main |
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