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Enhanced pallet detection in complex environments: an AM-Mask R-CNN method.

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Bibliographic Details
Title:	Enhanced pallet detection in complex environments: an AM-Mask R-CNN method.
Authors:	Shao, Yiping^1,2, Xu, Zhilong¹, Chen, Jun¹, Lu, Jiansha¹, ljs@zjut.edu.cn, Shen, Wenguang²
Source:	International Journal of Computer Integrated Manufacturing; Jun2026, Vol. 39 Issue 6, p865-885, 21p
Database:	Applied Science & Technology Source
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Description
ISSN:	0951192X
DOI:	10.1080/0951192X.2025.2501587